VLSI Practice Test 8

1. In CMOS devices, which has slower performance?

2. Electrons travels faster in

3. The process of removing equivalent faults is called as

4. IDDQ fault occurs when there is

5. ________ is used with silicon to satisfy the need for very high speed integrated technology.

6. Which is the lightest p-type dopant?

7. Surface impurities occurs due to ion migration.

8. Automatic test pattern generator detects only the fault and not its cause.

9. Which method is easiest to test?

10. Data retention time comes under __________ fault.